This six-part, interactive webcast series covers the full range of RF and wireless applications.
Attend this live webcast series to learn how a modular, software-defined platform can help reduce RF test time and increase speed in wireless prototyping. Experts will be on hand to answer your questions in real time.
The series is intended for test engineers, technicians, and managers facing the challenge to keep the cost of RF and wireless test low enough to maintain appropriate unit pricing.
To create the connected systems of tomorrow, a platform-based approach will be necessary to overcome the next generation of RF and wireless challenges. These include expanding to test billions of devices linked by the Internet of Things and prototyping the novel waveforms and air interfaces of 5G communications. This webcast will discuss the role modular and reconfigurable systems play in scaling for the changing needs, technologies and applications of wireless systems.
Presenter: Jeremy Twaits, Senior Technical Marketing Engineer, National Instruments
Because of the Internet of Things, the requirements for fast, precise, and cost-effective RF test of cellular and connectivity modules are continually increasing. Explore how the NI Wireless Test System (WTS) addresses the test requirements and challenges of high-volume manufacturers of cellular and wireless connectivity devices. We cover solutions for manufacturers of wireless devices such as WLAN and Bluetooth modules, mobile handsets, and automotive connectivity systems.
Presenter: Alejandro Buritica, Senior Product Marketing Manager, National Instruments
With the explosion of wireless technology, engineers are increasingly required to transition RFIC's from R&D to production test more quickly - and at a lower cost. In this session we will review some of the key technologies required for testing RFICs in R&D - such as envelope tracking (ET) and digital predistortion (DPD). In addition, we will introduce new features of the NI Semiconductor Test System that are used for production test cell integration.
Presenter: Haydn Nelson, Senior Product Marketing Manager, National Instruments
A transient signal is either a one-time event, or a periodic event in which the event duration is very short as compared to the period of the waveform. In RF and microwave systems, such events might be intentionally generated as pulses (radar signals), as noise, or as maliciously interfering transients. This webcast discusses how wideband real-time signal capture and analysis techniques can offer key insight which allows engineers to perform root-cause analysis and define mitigation strategy.
Presenter: Abhay Samant, Section Manager - RF, National Instruments
Designing and testing RADAR systems and subsystems requires a sophisticated combination of hardware and software. This session traverses the V-diagram from design to test, exploring the toolchain from front end simulation to rapid prototyping to system validation and test. Example applications will include multi-channel phase coherent measurement systems, compressive sensing for signal reconstruction and target generation for system testing.
Presenter: Raffaele Fiengo, Business Development Manager - Aerospace & Defense, National Instruments
Software Defined Radio allows rapid iteration on designs because it closely mirrors the functionality found in real wireless devices with the added flexibility of broader frequency coverage and re-programmable baseband processing. We discuss the platform-based approach to designing next generation wireless systems that allows design teams more efficiently utilize new, more advanced hardware and software while shortening time to results with deployment through reuse along the product development, validation, verification and deployment cycle.
Presenter: Erik Luther, Senior Group Manager - SDR, National Instruments