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Automated Test Summit 2012 Presentations

 

Automated Test Summit

KEYNOTE: Discover the Latest Trends in Test - Automated Test Outlook 2012

Every year, National Instruments compiles the Automated Test Outlook, a document that outlines the key trends impacting automated testing. This outlook draws upon insight from many leading vendors of PCs, data converters and software components as well as vital contributions from organisations at the forefront of automated testing. In this keynote, the top five trends predicted to impact automated test in the years to come are identified and explained.

Designing Software Frameworks for Maximum Test Throughput

An important piece of an automated test system is the software framework, which runs the tests, stores the data and evaluates the results. Learn about a four-layer architecture (instrumentation, drivers, test development software and test management software), discuss the variety of software tools available to test developers and discover how to choose the best tools for your application.

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Achieving Reuse from Development to Deployment with Flexible Hardware and Software

As automated test systems increase in complexity and requirements change, the need for a flexible and adaptable test platform becomes crucial. Learn how a software-defined approach to instrumentation, paired with modular PXI hardware, addresses the challenging dynamic of building and deploying automated test systems.

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Reliable Switching: A Day in the Life of a Relay

Learn how to develop sustainable switch systems that produce repeatable results. See demonstrations showing the most common causes of relay failure and explore switching architectures that are optimised for low-level measurements.

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Inline RF Signal Processing: Customising Measurements and Analysis with FPGA Technology

Implementing continuous software-defined radio systems requires large amounts of real-time, inline processing. With a standard PC-based architecture, it is difficult to achieve the processing speeds and data transfer rates required, so it is necessary to look to other computing nodes, such as DSPs or FPGAs. Throw in the need to test and measure MIMO-based standards, like 802.11ac (WLAN) and the amounts of data requiring analysis can become overwhelming. In this session, we shall discuss techniques for using FPGAs to perform inline signal processing for software-defined radio and MIMO-based wireless standards.

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Simplifying Complex Structural and Physical Test Systems 

Structural test systems require complex software that combines a variety of measurement types, including strain, pressure, temperature and vibration with precise control of an input stimulus. See LabVIEW architecture components that combine PXI sensor measurements with best-in-class synchronization for building high-channel-count structural test systems.

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Hands-On: Automated High-Performance Measurements on PXI-Based Modular Instruments

Get hands-on with PXI and modular instrumentation measurement hardware, such as scopes, DMMs, arbitrary function generators and switches. Perform tests on elements of electronic DUTs (devices under test) such as LED testing and lowpass filter characterisation. See how the combination of LabVIEW and modular instruments can be used to implement a virtual instrumentation approach to automated test, enabling automated measurements, data logging for post processing and inline analysis at run-time.

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Hands-On: Maximise Measurement Speed with FPGA-Based Hardware

Learn how to build an NI FlexRIO system from scratch. Understand how to take advantage of the flexible FPGA-based modular architecture to meet custom hardware requirements and perform inline processing.

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Hands-On: Build an Automated Test System with PXI and NI TestStand

Learn how to develop an automated test system from start to finish. Explore how to use NI TestStand test management software to quickly add sequencing, flow control, multithreading and reporting to your LabVIEW measurements and tests. See how to program NI modular instruments in PXI systems to perform functional tests on multiple devices to develop a high-throughput parallel test system.

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Hands-On: Introduction to Data Acquisition with NI LabVIEW and CompactDAQ

Test-drive PC-based data acquisition systems and learn how to use graphical programming techniques to create modular and flexible applications. Measure temperature with a thermocouple and log the data to a file. NI data acquisition and signal conditioning products offer highly accurate measurements, combined with NI LabVIEW to give you the power to easily acquire, analyse and present your data in minutes.

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Hands-On: Managing and Processing Test Data with NI DIAdem

Gigabytes, even Terabytes, of data are becoming commonplace in many test and measurement applications. Explore how NI DIAdem and the TDM file format harness new data storage technologies to enable you to effectively save, document, search and use these data sets.

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Hands-On: Introduction to NI TestStand

Learn how to develop automated test and validation systems faster with NI TestStand. In this session, you will get the opportunity to sequence, schedule and debug test modules with the TestStand sequence editor, before running a complete test and analysing the results.

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Hands-On: Creating Scalable Test Architectures with Object-Oriented Design Patterns

See how to map the most important requirements of your application to established design patterns to maximise the scalability and reusability of your LabVIEW code. This session will demonstrate various implementations of state machines and producer consumer loops to solve common problems such as plug-in frameworks and hardware abstraction layers.

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Hands-On: Introduction to RF Systems on PXI

RF development doesn't have to be limited to RF engineers. See how your skills in data acquisition and modular instrumentation can be directly applied to RF development, to simplify the generation and analysis of communications signals.

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Certified LabVIEW Developer Exam Preparation Class

Attend this class to discover how to avoid the most common pitfalls and misconceptions in the Certified LabVIEW Developer (CLD) exam and give you the best chance to pass with flying colours.

 

Certified LabVIEW Associate Developer Exam

NI certifications are industry-recognised credentials that distinguish expertise in using NI products for developing measurement and automation solutions. Take your first step onto the certification ladder and take your Certified LabVIEW Associate Developer (CLAD) examination during the event.

 

Certified TestStand Developer Exam

The Certified TestStand Developer exam, tests engineers on a broad and complete understanding of NI TestStand core features and functionality. You can now register to take your Certified TestStand Developer (TSD) examination during the event.


Meet the Engineer

Take the opportunity at the Summit to sit down with one of our qualified Systems Engineers and discuss your application. Register at reception on the day.