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Automated Test Summit 2014: Presentations

This free, full day event allowed attendees to learn more about the top trends and technologies influencing automated test and featured a presentation track dedicated to the RF industry. The event brought together NI and industry experts for technology discussions, case studies, hands-on training and networking opportunities.

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Download Keynote Slides
Download AT Track presentation slides
Download RF & Microwave presentation slides
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08:45

Registration

09:30

Keynote: An Overview of the Use of Economic Analysis to Determine the Optimum Test Strategy for Electronics Design, Manufacturing and Support - Brendan Davis

The speed of bringing cost-effective, high-technology and high-quality products to market is of key importance in today’s competitive environment. The use of automatic test equipment that can minimize costs, maximize productivity and maintain or improve quality, has an important role to play in gaining the necessary advantage. However, it has to be used effectively.

10:00

Break and Exhibition

10:30

What's New in NI TestStand 2013

Examine the new features of NI TestStand 2013 test management software. Learn how deployment patching can simplify the maintenance of existing deployments and how new engine optimisations can increase your available memory and improve overall run-time performance.

11:00

Guest Presentation: Closing the Loop: Design Improvement through Automated Test - Simplicity AI

11:30

Top Development Tips and Tricks for NI TestStand

This presentation explains top recommendations for TestStand developers who are looking to improve their overall development practices. Tips include how to configure your TestStand workspace for better management of source files, reusing common code modules, and modifying common properties across test sequences throughout your software development process.

12:30

Lunch and Exhibition

13:30

Advanced Features of PXI: Timing, Synchronisation and Streaming

Explore some of the most advanced PXI platform capabilities. Examples include synchronisation across multiple distributed chassis, clock disciplining and data streaming and storage.

14:00

Guest Presentation: 6TL Engineering

14:30

Break and Exhibition

14:45

Replicating Real-World Environments with Test Cells

Test cells combine industrial machinery with precision control and laboratory-quality measurements to replicate real-world environments for individual components, systems of components, and complete vehicles. See how NI’s wide breadth of I/O, huge range of control options and configurable software are uniquely positioned to provide a greater level of integration for test cell applications.

 

15:45

Total Quality Management Approach

Embedded control software is growing exponentially in mechanical systems, which forces test methods to evolve even faster. Hear how end-to-end traceability and test component reuse are providing superior system quality and validation efficiency for these systems by enabling consistent testing, results analysis and traceability throughout the development process.

15:45

Wrap-Up and Closing

09:00

Welcome and Introduction

09:30

Keynote: An Overview of the Use of Economic Analysis to Determine the Optimum Test Strategy for Electronics Design, Manufacturing and Support - Brendan Davis

The speed of bringing cost-effective, high-technology and high-quality products to market is of key importance in today’s competitive environment. The use of automatic test equipment that can minimize costs, maximize productivity and maintain or improve quality, has an important role to play in gaining the necessary advantage. However, it has to be used effectively.

10:00

Break and Exhibition

10:30

Applying Synthetic Instrumentation to Reduce the Cost of Test

Synthetic Instrumentation can lower the total ownership cost of test by reducing the number of legacy instruments needed, aiding in the insertion of new technology during the life cycle and reducing sustainment costs. In this session we'll explore how the modular, software-defined RF platform from National Instruments can be used from design all the way to production test to achieve these goals.

11:30

5 Ways to Accelerate Mixed-Signal Testing

Explore five methods of reducing the cost and accelerating the speed of testing mixed-signal devices, with specific examples such as wireless transceivers, microelectromechanical systems (MEMS) and digital cameras. Techniques include optimising switch scanning, reducing settling time and parallelising test execution.

 

12:30

Lunch and Exhibition

13:30

802.11ac: Overcoming Test Challenges Up to 160 MHz Bandwidth

Review some of the key technology enhancements introduced in the IEEE 802.11ac wireless networking standard. Learn key differences between existing 802.11a, b, g, n and ac standards and some of the key test challenges introduced.

14:30

Break and Exhibition

14:45

Power Amplifier Testing: Digital Predistortion and Envelope Tracking

Power amplifiers are exceptionally important components of modern communications systems. This presentation will discuss techniques for increasing both the efficiency and linearity of these devices, to reduce power wastage, increase battery lives and improve signal quality. Learn about envelope tracking, in which the power supply voltage applied is adjusted to ensure the amplifier is operating at peak efficiency, and digital predistortion, which compensates for system nonlinearities.

15:45

Prototyping and Testing RADAR Systems

Designing a complex, modern system from schematic through actual field testing is a complex and daunting task. In this session, learn how to design and prototype RADAR systems in software, linking NI LabVIEW to AWR Visual System Simulator (VSS) for signal processing and co-simulation. Also examine methods for RADAR prototyping and field simulation using PXI RF signal generators and analysers.

16:45

Wrap-Up and Closing

 

 

09:00

Welcome and Introduction

09:30

Keynote: An Overview of the Use of Economic Analysis to Determine the Optimum Test Strategy for Electronics Design, Manufacturing and Support - Brendan Davis

The speed of bringing cost-effective, high-technology and high-quality products to market is of key importance in today’s competitive environment. The use of automatic test equipment that can minimize costs, maximize productivity and maintain or improve quality, has an important role to play in gaining the necessary advantage. However, it has to be used effectively.

10:00

Break and Exhibition

10:30

Hands-On: Automated High-Performance Measurements on PXI-Based Modular Instruments with LabVIEW

Get hands-on with PXI and modular instrumentation measurement hardware, such as scopes, DMMs, arbitrary function generators and switches. Perform tests on elements of electronic DUTs (devices under test) such as LED testing and lowpass filter characterisation. See how the combination of LabVIEW and modular instruments can be used to implement a virtual instrumentation approach to automated test, enabling automated measurements, data logging for post processing and inline analysis at run-time.

12:30

Lunch and Exhibition

13:30

Hands-On: Maximise Measurement Speed with FPGA-Based Hardware

Learn how to build an NI FlexRIO system from scratch. Understand how to take advantage of the flexible FPGA-based modular architecture to meet custom hardware requirements and perform inline processing.

14:30

Break and Exhibition

14:45

Hands-On: Build an Automated Test System with PXI and NI TestStand

Learn how to develop an automated test system from start to finish. Explore how to use NI TestStand test management software to quickly add sequencing, flow control, multithreading and reporting to your LabVIEW measurements and tests. See how to program NI modular instruments in PXI systems to perform functional tests on multiple devices to develop a high-throughput parallel test system.

16:45

Wrap-Up and Closing

09:00

Welcome and Introduction

09:30

Keynote: An Overview of the Use of Economic Analysis to Determine the Optimum Test Strategy for Electronics Design, Manufacturing and Support - Brendan Davis

The speed of bringing cost-effective, high-technology and high-quality products to market is of key importance in today’s competitive environment. The use of automatic test equipment that can minimize costs, maximize productivity and maintain or improve quality, has an important role to play in gaining the necessary advantage. However, it has to be used effectively.

10:00

Break and Exhibition

10:30

Hands-On: Introduction to LabVIEW and Data Acquisition with NI CompactDAQ

Test-drive PC-based data acquisition systems and learn how to use graphical programming techniques to create modular and flexible applications. Measure temperature with a thermocouple and log the data to a file. NI data acquisition and signal conditioning products offer highly accurate measurements, combined with NI LabVIEW to give you the power to easily acquire, analyse and present your data in minutes.

11:30

Hands-On: Building a Software-Defined Radio System with NI USRP

Discover how you can use LabVIEW system design software to design, prototype and deploy a wireless communications system with the NI USRP software-defined radio (SDR) platform. Build a simple spectrum analyser, demodulate over-the-air broadcast FM radio and prototype a wireless digital communications system.

12:30

Lunch and Exhibition

13:30

Hands-On: Introduction to RF Systems on PXI

Review RF measurement fundamentals such as IP3, adjacent power channel ratio and modulation accuracy. Test drive the NI PXIe-5644R vector signal transceiver using intuitive graphical user interfaces to perform fundamental wireless test measurements.

14:30

Break and Exhibition

14:45

Hands-On: Acquiring Wireless Connectivity, Cellular and Broadcast Measurements with PXI

Explore measurements from GSM and LTE, to 802.11 wireless standards, to FM/RDS and GPS/ GLONASS signals. Experiment with soft front panels for interactive measurements and use LabVIEW to parallelise acquisition, benchmark performance and program the FPGA on the vector signal transceiver to optimise measurements.

16:45

Wrap-Up and Closing

Certification - at the Automated Test Summit 2014

National Instruments (NI) certification offers industry-recognised credentials that distinguish expertise in using NI products for developing measurement and automation solutions. NI offers three levels of certification for the new, experienced and expert NI product users.

09:00

Welcome and Introduction

09:30

Keynote: An Overview of the Use of Economic Analysis to Determine the Optimum Test Strategy for Electronics Design, Manufacturing and Support - Brendan Davis

The speed of bringing cost-effective, high-technology and high-quality products to market is of key importance in today’s competitive environment. The use of automatic test equipment that can minimize costs, maximize productivity and maintain or improve quality, has an important role to play in gaining the necessary advantage. However, it has to be used effectively.

10:00

Break and Exhibition

10:30

Certified LabVIEW Developer Exam Preparation Class

Are you a Certified LabVIEW Associate Developer ready to take the next step? Attend this preparation class to discover how to avoid the most common pitfalls and misconceptions in the Certified LabVIEW Developer exam and give you the best chance to pass with flying colours.

11:30

Certified LabVIEW Associate Developer Exam

Take your first step onto the certification ladder with the Certified LabVIEW Associate Developer (CLAD) exam during the summit.

12:30

Lunch and Exhibition

13:30

Certified TestStand Developer Exam

At the event, sit your Certified TestStand Developer exam, where you must show a broad and complete understanding of TestStand core features and functionality.

14:30

Break and Exhibition

14:45

Certified LabVIEW Associate Developer Exam

Take your first step onto the certification ladder with the Certified LabVIEW Associate Developer (CLAD) exam during the summit.

15:45

Certified LabVIEW Developer Exam Preperation Class

Are you a Certified LabVIEW Associate Developer ready to take the next step? Attend this preparation class to discover how to avoid the most common pitfalls and misconceptions in the Certified LabVIEW Developer exam and give you the best chance to pass with flying colours.

16:45

Wrap-Up and Closing

Prize Draw

All delegates are eligible to enter a prize draw to be in with a chance of winning:

 

1st Prize: £200 Red Letter Days voucher and a LEGO MINSTORM EV3, powered by LabVIEW.
2nd Prize: £100 Red Letter Days voucher and a LEGO MINSTORM EV3, powered by LabVIEW.
3rd Prize: £50 Red Letter Days voucher and a LEGO MINSTORM EV3, powered by LabVIEW.

 

To find out more, please visit ni.com/mindstorms and redletterdays.co.uk

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