The rapid integration of wireless connectivity into existing products demands that today’s test engineers understand a breadth of RF & wireless test techniques from performing EVM and ACLR measurements to addressing complex MIMO applications. National Instruments provides a suite of test equipment and software to increase test reliability and accuracy, provide measurement flexibility, as well as reduce test times.
Register for the RF measurement webcasts below to learn the fundamentals of making and optimising RF measurements.
In an attempt to accommodate your schedule, you will have the opportunity to choose from 2 different times for each webcast, while still being able to interact with the presenter and other colleagues in your field of expertise.
This webcast introduces common GPS receiver tests including sensitivity, TTFF, position and tracking accuracy. It demonstrates an innovative way of bringing GPS signals into the lab for comprehensive GPS test using a hybrid of simulated signal generation as well as real-world signal record and playback. In addition to going over measurement fundamentals, we walk through hardware and software demonstrations of these GPS receiver tests using both simulated and real-world signals in the lab.
Optimising measurement speed is often one of the most important considerations when creating an automated RF test system. As a result, we have seen a growing trend for RF engineers to replace rack-and-stack RF measurement test benches with much faster PXI test equipment.In this webcast, we explore the fundamental technologies that enable PXI test equipment to achieve measurement times 5-10X faster than traditional rack-and-stack instruments. In addition, we walk through an exhaustive measurement speed and performance comparison between the PXI RF signal analysers and the Agilent MXA and PXA RF signal analysers. Finally, this session explains several tips to optimise measurement speed.
This session covers the advantages gained from using multiple antennas in a communications channel, using 802.11n as a real-world use case. Concepts such as OFDM, channel fading, and spatial multiplexing are covered in their context of the 802.11n WLAN standard, as well as a general overview of phase-coherent measurement systems and how they relate to MIMO applications such as 802.11n. A general demonstration of a 2x2 Tx / Rx system is performed with phase-coherent signal generators and analysers, including a demonstration of actual multi-channel 802.11n measurements.
Making accurate, S-parameter measurements is challenging, even with modern test equipment and methods. The vector network analyser (VNA) has become the instrument of choice for many RF measurements due to its exceptional accuracy and flexibility. This session addresses important considerations regarding calibration, measurement speed, and programming when adding network analysis to your automated test systems. Several advanced topics including pulsed S-parameter measurements, time domain analysis and effective de-embedding techniques will also be introduced.
Testing cellular power amplifiers requires a suite of instrumentation and poses unique considerations. With over 1 billion mobile phones sold per year, many with multiple PAs per part, lowering test times to increase throughput is becoming increasingly critical. This session will provide an overview for both hardware and software solutions available from National Instruments to address cellular PA test. Several best practices to fully optimise GSM, EDGE and WCDMA measurements for PAs will also be demonstrated.
Learn how PXI express technology is used with RF instrumentation for high throughput data streaming to a host PC or to an FPGA for processing. This session also explores ways of reducing software dependencies for processing by streaming data to and from one or more FPGA modules embedded in the PXI chassis for real time processing and spectrum analysis.
This session will introduce fundamental principles and concepts of the 3GPP Long Term Evolution (LTE) standard. Explore the fundamentals of the LTE signal structure, introducing fundamental concepts such as orthogonal frequency division multiple access (OFDMA) and single carrier frequency division multiple access (SC-FDMA). This session will also address several of the nuances of physical layer measurements including error vector magnitude (EVM) and adjacent channel power (ACP) with demonstrations of the latest automated measurements systems available.